Standard Specification for Molybdenum Flattened Wire for Electron Tubes
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Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices
Standard Specification for Fine Aluminum-1% Magnesium Wire for Semiconductor Lead-Bonding
Standard Specification for Tungsten Wire for Electron Devices and Lamps
Standard Specification for Nickel Strip for Electron Tubes
Standard Specification for Iron-Nickel Sealing Alloys
Standard Specification for Molybdenum Wire and Rod for Electronic Applications
Standard Specification for Fine Aluminum-1% Silicon Wire for Semiconductor Lead-Bonding
Standard Test Method for Sag of Tungsten Wire
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
Standard Specification for Tungsten-Rhenium Alloy Wire for Electron Devices and Lamps
Standard Practice for Nondestructive Pull Testing of Wire Bonds
Standard Test Method for Thickness and Thickness Variation of Silicon Wafers
Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
Standard Test Methods for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
