Standard Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers (Withdrawn 2003)
This product is not for sale, please contact us for more information
Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets, Method 2 (Withdrawn 2007)
Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
Standard Terminology for Membrane Switches
Standard Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry (Withdrawn 2003)
Standard Specification for Nickel-Chromium-Iron Sealing Alloys
Standard Specification for Iron-Nickel-Cobalt Sealing Alloy
Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps
Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Standard Test Method for Contact Closure Cycling of a Membrane Switch (Withdrawn 2023)
Standard Test Method for Determining the Effectiveness of Membrane Switch ESD Shielding
Standard Test Methods for Measuring Contrast of a Linear Polarizer
Standard Test Method for Tension and Vacuum Testing Metallized Ceramic Seals (Withdrawn 2023)
