Standard Specification for Nickel-Chromium-Iron Sealing Alloys (Withdrawn 2024)
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Standard Specification for Metallized Surfaces on Ceramic (Withdrawn 2023)
Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers (Withdrawn 2003)
Standard Guide for Application of Certified Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon (Withdrawn 2003)
Standard Practices for Monitoring Non-Contact Dielectric Characterization Systems Through Use of Special Reference Wafers (Withdrawn 2003)
Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
Test Methods for Destructive Shear Testing of Ball Bonds
Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds
Standard Specification for Gold Wire for Semiconductor Lead Bonding
Standard Practice for Determining Barium Yield, Getter Gas Content, and Getter Sorption Capacity for Barium Flash Getters
Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Standard Test Method for Surface Flaws in Tungsten Seal Rod and Wire
Standard Specification for Semiconductor Device Passivation Opening Layouts
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Specification for Brazing Filler Metals for Electron Devices
