Standard Specification for Round Wire for Winding Electron Tube Grid Laterals
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Standard Practice for Determining Solderability of Thick Film Conductors
Standard Test Method for Wavelength of Peak Photoluminescence and the Corresponding Composition of Gallium Arsenide Phosphide Wafers (Withdrawn 2008)
Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
Standard Specification for Integrated Circuit Lead Frame Material
Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array
Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage
Standard Test Method for Resistivity of Silicon Bars Using a Two-Point Probe
Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum
Standard Test Method for Thickness of Heteroepitaxial or Polysilicon Layers (Withdrawn 2002)
Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements (Withdrawn 2008)
Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
Standard Practice for Nondestructive Pull Testing of Wire Bonds
Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds
