Guide for Selecting Methods of Temperature Measurement of Thermionic Emitters (Withdrawn 2001)
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Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal (Withdrawn 2003)
Standard Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Standard Specification for Iron-Nickel Sealing Alloys
Standard Specification for 42% Nickel-6% Chromium-Iron Sealing Alloy
Standard Test Methods for Conductivity Type of Extrinsic Semiconducting Materials
Standard Specification for Metallized Surfaces on Ceramic
Standard Specification for Gold Wire for Semiconductor Lead Bonding
Standard Specification for Tungsten-Rhenium Alloy Wire for Electron Devices and Lamps
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Standard Test Method for Calibration of Helium Leak Detectors by Use of Secondary Standards
Standard Test Method for Measuring Radial Resistivity Variation on Silicon Wafers (Withdrawn 2003)
Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
