Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
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Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy
Standard Guide for Performing Sputter Crater Depth Measurements
Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy (Withdrawn 2016)
Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
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Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
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Standard Guide for Depth Profiling in Auger Electron Spectroscopy
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
