Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
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Standard Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function
Standard Practice for Tissue Cryosection Analysis with SIMS
Standard Guide for Cell Culture Analysis with SIMS
Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024)
Standard Specification for Dimensions of Knife-Edge Flanges
Standard Terminology Relating to Surface Analysis
Standard Guide for Handling Specimens Prior to Surface Analysis
Standard Practice for Approximate Determination of Current Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces
Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
