Standard Guide for Specimen Preparation and Mounting in Surface Analysis
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Standard Guide for Handling Specimens Prior to Surface Analysis
Standard Specification for Dimensions of Knife-Edge Flanges
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Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
Standard Practice for Tissue Cryosection Analysis with SIMS
Standard Guide for Cell Culture Analysis with SIMS
Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015)
Standard Terminology Relating to Surface Analysis (Withdrawn 2012)
Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS
Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
