Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
€58.00
Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
€65.00
Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
Standard Guide for Handling Specimens Prior to Surface Analysis
Standard Practice for Tissue Cryosection Analysis with SIMS
Standard Guide for Cell Culture Analysis with SIMS
Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
€72.00
Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
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Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
Standard Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards (Withdrawn 2010)
Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis
Standard Guide for Performing Sputter Crater Depth Measurements
