SEMICONDUCTOR DEVICES

UNE-EN 61988-4:2007

UNE-EN 61988-4:2007

Withdrawn Most Recent

Plasma display panels - Part 4: Climatic and mechanical testing methods

€71.00

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UNE-EN 60749-15:2011

UNE-EN 60749-15:2011

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

€50.00

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UNE-EN 60749-34:2011

UNE-EN 60749-34:2011

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Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling

€59.00

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UNE-EN 60749-23:2005/A1:2011

UNE-EN 60749-23:2005/A1:2011

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Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life

€28.00

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UNE-EN 60749-30:2005/A1:2011

UNE-EN 60749-30:2005/A1:2011

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

€47.00

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UNE-EN 60749-19:2003/A1:2011

UNE-EN 60749-19:2003/A1:2011

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Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength

€28.00

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UNE-EN 60749-32:2004/A1:2011

UNE-EN 60749-32:2004/A1:2011

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Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)

€35.00

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UNE-EN 60191-6-10:2004

UNE-EN 60191-6-10:2004

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Mechanical standardization of semiconductor devices -- Part 6-10: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Dimensions of P-VSON

€59.00

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UNE-EN 60749-1:2004

UNE-EN 60749-1:2004

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Semiconductor devices - Mechanical and climatic test methods -- Part 1: General

€50.00

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UNE-EN 60749-8:2004

UNE-EN 60749-8:2004

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Semiconductor devices - Mechanical and climatic test methods -- Part 8: Sealing

€62.00

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UNE-EN 60749-14:2004

UNE-EN 60749-14:2004

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Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)

€60.00

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UNE-EN 60749-25:2004

UNE-EN 60749-25:2004

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Semiconductor devices - Mechanical and climatic test methods -- Part 25: Temperature cycling

€59.00

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UNE-EN 60749-33:2005

UNE-EN 60749-33:2005

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Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave

€40.00

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UNE-EN 60749-24:2005

UNE-EN 60749-24:2005

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Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST

€47.00

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UNE-EN 60749-23:2005

UNE-EN 60749-23:2005

Active Most Recent

Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life

€50.00

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