31.240 : Mechanical structures for electronic equipment

DIN IEC 47D/331/CDV:2000-05

DIN IEC 47D/331/CDV:2000-05

Withdrawn Most Recent

Semiconductor devices, mechanical standardization - QFN-outline drawings to the outline family 119E (IEC 47D/331/CDV:1999)

€63.27

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DIN IEC 47D/362/CD:2000-12

DIN IEC 47D/362/CD:2000-12

Superseded Historical

Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages; Standard overall package height; Amendment 1 to IEC 60191-4 (IEC 47D/362/CD:2000)

€34.30

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DIN IEC 47D/332/CD:2000-12

DIN IEC 47D/332/CD:2000-12

Withdrawn Most Recent

Amendment 2 to IEC 60191-6: Mechanical standardization of semiconductor devices - Pin grid array 2,54 mm pitch outline family (Intended for inclusion into IEC 60191-2) (IEC 47D/332/CD:1999)

€48.79

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DIN IEC 60191-2-47:2001-10

DIN IEC 60191-2-47:2001-10

Withdrawn Most Recent

Semiconductor devices, mechanical standardization, 3-Leaded SMD (Body Size D x E: 2.9 x 1.5 mm) outline family 162 E (IEC 47D/440/FDIS:2001)

€34.30

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DIN IEC 60191-6-11:2001-10

DIN IEC 60191-6-11:2001-10

Withdrawn Most Recent

General design guideline for rectangular FBGA packages (IEC 47D/394/CDV:2000)

€91.03

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ANSI/VITA 58.0:2009 (S2022) (R2014)

ANSI/VITA 58.0:2009 (S2022) (R2014)

Active Most Recent

Line Replaceable Integrated Electronics Chassis Standard

€27.50

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ANSI/VITA 58.1:2013 (S2022)

ANSI/VITA 58.1:2013 (S2022)

Active Most Recent

Line Replaceable Integrated Electronics Chassis Standard, Liquid Cooled Chassis

€27.50

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ASTM F542-02

ASTM F542-02

Superseded Historical

Standard Test Method for Exothermic Temperature of Encapsulating Compounds for Electronic and Microelectronic Encapsulation

This product is not for sale, please contact us for more information

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ASTM F18-64(2000)

ASTM F18-64(2000)

Superseded Historical

Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices

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ASTM F375-89(1999)

ASTM F375-89(1999)

Superseded Historical

Standard Specification for Integrated Circuit Lead Frame Material

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ASTM F542-98

ASTM F542-98

Superseded Historical

Standard Test Method for Exothermic Temperature of Encapsulating Compounds for Electronic and Microelectronic Encapsulation

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ASTM F29-97(2002) (R1997)

ASTM F29-97(2002) (R1997)

Superseded Historical

Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications

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ASTM F375-89(2005)

ASTM F375-89(2005)

Superseded Historical

Standard Specification for Integrated Circuit Lead Frame Material

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ASTM F18-64(2006)

ASTM F18-64(2006)

Superseded Historical

Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices

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ASTM E2444-05e1

ASTM E2444-05e1

Superseded Historical

Terminology Relating to Measurements Taken on Thin, Reflecting Films

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