Mask engineering; masks for integrated optics
€71.85
Mask engineering - Pattern
€51.99
Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 3: Aluminium; gravimetric method
€34.30
Testing of materials for semiconductor technology - Determination of dislocations in monocrystals of III-V-compound semi-conductors - Part 1: Gallium arsenide
€63.27
Mask engineering - Pellicles
IEC 60146-1-1:2024/COR1:2025 Corrigendum 1 - Semiconductor converters - General requirements and line commutated converters - Part 1-1: Specification of basic requirements
This product is not for sale, please contact us for more information
IEC 60146-1-3:1991 Semiconductor convertors - General requirements and line commutated convertors - Part 1-3: Transformers and reactors
€93.00
Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 4: Slice diameter, diameter variation, flat diameter, flat length, flat depth
€48.79
Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide
Testing of materials for semiconductor technology - Determination of the volume fraction of components in dopant gas mixtures by wet-chemical methods - Part 1: Diborane in hydrogen diborane mixtures
Testing of materials for semiconductor technology - Determination of the volume fraction of components in dopant gas mixtures by wet-chemical methods - Part 2: Phosphine in nitrogen phosphine mixtures
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 3: Determination of cationic impurities
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
€56.17
Testing of materials for semiconductor technology - Determination of defect types and defect densities of silicon epitaxial layers
