Test and Diagnosis for Electronic Systems

IEEE 771:1989

IEEE 771:1989

Superseded Historical

IEEE Guide to the Use of the ATLAS Specification

€209.00

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IEEE 993:1990

IEEE 993:1990

Withdrawn Most Recent

IEEE Trial-Use Standard for Test Equipment Description Language (TEDL)

€167.00

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IEEE 993:1997

IEEE 993:1997

Withdrawn Most Recent

IEEE Standard for Test Equipment Description Language (TEDL)

€146.00

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IEEE/IEC 61636:2021

IEEE/IEC 61636:2021

Active Most Recent

IEC/IEEE International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA)

€74.00

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IEEE/IEC 61636-1:2021

IEEE/IEC 61636-1:2021

Active Most Recent

IEC/IEEE International Standard-Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)

€63.00

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IEEE P2848

IEEE P2848

Active Most Recent

IEEE Draft Standard for Prognostics and Health Management in Automatic Test Systems

€102.00

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