Test and Diagnosis for Electronic Systems

IEEE 1871.1:2014

IEEE 1871.1:2014

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IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters

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IEEE 1871.2:2017

IEEE 1871.2:2017

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IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment

€55.00

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IEEE/IEC 61671:2012

IEEE/IEC 61671:2012

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IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

€354.00

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IEEE 488.1:2003 (R2009)

IEEE 488.1:2003 (R2009)

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IEEE Standard For Higher Performance Protocol for the Standard Digital Interface for Programmable Instrumentation

€381.00

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IEEE 716:1995 (R2011)

IEEE 716:1995 (R2011)

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IEEE Standard Test Language for All Systems - Common/Abbreviated Test Language for All Systems (C/ATLAS)

€244.00

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IEEE 1636.2:2018

IEEE 1636.2:2018

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IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Maintenance Action Information via the Extensible Markup Language (XML)

€56.00

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IEEE 1641.1a:2018

IEEE 1641.1a:2018

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IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language

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IEEE 1445:2016

IEEE 1445:2016

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IEEE Standard for Digital Test Interchange Format (DTIF)

€79.00

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IEEE/IEC 63003:2015

IEEE/IEC 63003:2015

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IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)

€319.00

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IEEE/IEC 63004:2015

IEEE/IEC 63004:2015

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IEC/IEEE International standard for receiver fixture interface

€308.00

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IEEE 1636:2018

IEEE 1636:2018

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IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)

€65.00

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IEEE/IEC 61671-2:2016

IEEE/IEC 61671-2:2016

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IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description

€79.00

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IEEE/IEC 61671-4:2016

IEEE/IEC 61671-4:2016

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IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration

€79.00

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IEEE/IEC 61671-5:2016

IEEE/IEC 61671-5:2016

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IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description

€64.00

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IEEE/IEC 61671-6:2016

IEEE/IEC 61671-6:2016

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IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description

€64.00

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