Test and Diagnosis for Electronic Systems

IEEE 1226.1:1993

IEEE 1226.1:1993

Withdrawn Most Recent

IEEE ABBET(TM) Trial-Use Standard for Common Ada Packages for A Broad-Based Environment for Test (ABBET(TM))

€173.00

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IEEE 1226.2:1993

IEEE 1226.2:1993

Withdrawn Most Recent

IEEE ABBET(TM) Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for A Broad-Based Environment for Test (ABBET(TM))

€203.00

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IEEE 1226.6:1996

IEEE 1226.6:1996

Withdrawn Most Recent

IEEE ABBET(R)- IEEE Guide for the Understanding of the "A Broad-Based Environment for Test (ABBET)(R)" Standard

€54.00

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IEEE 1232:1995

IEEE 1232:1995

Superseded Historical

IEEE Standard for Artificial Intelligence and Expert System Tie to Automatic Test Equipment (AI-ESTATE): Overview and Architecture

€155.00

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IEEE 1232:2002

IEEE 1232:2002

Superseded Historical

IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE)

€320.00

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IEEE 1232.1:1997

IEEE 1232.1:1997

Superseded Historical

IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Data and Knowledge Specification

€155.00

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IEEE 1232.2:1998

IEEE 1232.2:1998

Superseded Historical

IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Service Specification

€173.00

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IEEE 1445:1998 (R2009)

IEEE 1445:1998 (R2009)

Superseded Historical

IEEE Standard for Digital Test Interchange Format (DTIF)

€126.00

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IEEE 1522:2004

IEEE 1522:2004

Withdrawn Most Recent

IEEE Standard for Testability and Diagnosability Characteristics and Metrics

€85.00

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IEEE 1545:1999

IEEE 1545:1999

Withdrawn Most Recent

IEEE Standard for Parametric Data Log Format

€138.00

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IEEE 1546:2000 (R2011)

IEEE 1546:2000 (R2011)

Withdrawn Most Recent

IEEE Guide for Digital Test Interchange Format (DTIF) Application

€123.00

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IEEE 1641:2004

IEEE 1641:2004

Superseded Historical

IEEE Standard for Signal and Test Definition

€419.00

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IEEE 416:1984

IEEE 416:1984

Withdrawn Most Recent

IEEE Standard ATLAS Test Language

€417.00

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IEEE 716:1989

IEEE 716:1989

Superseded Historical

IEEE Standard C/ATLAS Test Language

€143.00

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IEEE 771:1984

IEEE 771:1984

Superseded Historical

IEEE Guide to the Use of ATLAS

€285.00

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