Test and Diagnosis for Electronic Systems

IEEE/IEC 62243:2002

IEEE/IEC 62243:2002

Superseded Historical

IEC/IEEE International Standard - Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)

€320.00

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IEEE/IEC 62529:2007

IEEE/IEC 62529:2007

Superseded Historical

IEC 62529 Ed. 1 Standard for Signal and Test Definition

€408.00

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IEEE 1505:2010

IEEE 1505:2010

Withdrawn Most Recent

IEEE Standard for Receiver Fixture Interface

€148.00

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IEEE 1641:2010

IEEE 1641:2010

Withdrawn Most Recent

IEEE Standard for Signal and Test Definition

€454.00

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IEEE 1636:2009

IEEE 1636:2009

Superseded Historical

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)

€78.00

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IEEE 1636.1:2013

IEEE 1636.1:2013

Superseded Historical

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)

€135.00

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IEEE 716:1985

IEEE 716:1985

Superseded Historical

IEEE Standard C/ATLAS Test Language

€81.00

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IEEE/IEC 62243:2010

IEEE/IEC 62243:2010

Active Most Recent

IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

€331.00

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IEEE 1636.1-2018/Cor 1:2023

IEEE 1636.1-2018/Cor 1:2023

Active Most Recent

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML) - Corrigenda 1

€0.00

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IEEE 1671.1-2017/Cor 1:2023

IEEE 1671.1-2017/Cor 1:2023

Active Most Recent

IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1

€0.00

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IEEE/IEC 62529:2024

IEEE/IEC 62529:2024

Active Most Recent

IEEE/IEC International Standard for Signal and Test Definition

€201.00

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IEEE 1155:1992

IEEE 1155:1992

Withdrawn Most Recent

IEEE Standard for VMEbus Extensions for Instrumentation: VXIbus

€227.00

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IEEE 1174:2000 (R2009)

IEEE 1174:2000 (R2009)

Withdrawn Most Recent

IEEE Standard Serial Interface for Programmable Instrumentation

€126.00

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IEEE 1226:1993

IEEE 1226:1993

Superseded Historical

IEEE ABBET(TM) Trial-Use Standard for A Broad-Based Environment for Test (ABBET) Overview and Architecture

€138.00

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IEEE 1226:1998

IEEE 1226:1998

Withdrawn Most Recent

IEEE Standard for a Broad-Based Environment for Test (ABBET(TM)), Overview and Architecture

€123.00

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