Superseded
Standard
Historical
IEC 61163-1:1995
Reliability stress screening - Part 1: Repairable items manufactured in lots
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Summary
These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/14/1995 |
| Release Date | 08/14/1995 |
| Cancellation Date | 06/26/2006 |
| Edition | 1 |
| Page Count | 153 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
14/08/1995
Superseded
Historical
22/12/1999
Superseded
Historical
26/06/2006
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