Superseded
Standard
Historical
IEC 60747-5-3:1997
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Preview
Summary
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 09/05/1997 |
| Release Date | 09/05/1997 |
| Cancellation Date | 02/23/2016 |
| Edition | 1 |
| Page Count | 61 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
05/09/1997
Superseded
Historical
No products.