Superseded
Standard
Historical
IEC 60747-5-3:1997+AMD1:2002 Consolidated
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
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Summary
IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
This consolidated version consists of the first edition (1997)
and its amendment 1 (2002). Therefore, no need to order amendment in
addition to this publication.
This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.
This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 11/25/2009 |
| Release Date | 11/25/2009 |
| Cancellation Date | 02/23/2016 |
| Edition | 1.1 |
| Page Count | 86 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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