31.200 : Integrated circuits. Microelectronics

IEC 61967-6:2002/COR1:2010

IEC 61967-6:2002/COR1:2010

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IEC 61967-6:2002/COR1:2010 Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

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IEC TR 62433-2-1:2010

IEC TR 62433-2-1:2010

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IEC TR 62433-2-1:2010 EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission

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IEC 61967-8:2011

IEC 61967-8:2011

Superseded Historical

IEC 61967-8:2011 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

€133.00

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IEC 62132-8:2012

IEC 62132-8:2012

Superseded Historical

IEC 62132-8:2012 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

€186.00

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IEEE 605:1987

IEEE 605:1987

Superseded Historical

IEEE Guide for Design of Substation Rigid-Bus Structures

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IEEE 605:1998

IEEE 605:1998

Superseded Historical

IEEE Guide for the Design of Substation Rigid-Bus Structures

€178.00

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IEEE 695:1990

IEEE 695:1990

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IEEE Standard for Microprocessor Universal Format for Object Modules

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IEC 61967-6:2002

IEC 61967-6:2002

Active Most Recent

IEC 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

€244.00

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IEC 61967-5:2003

IEC 61967-5:2003

Withdrawn Most Recent

IEC 61967-5:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method

€186.00

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IEC TS 61967-3:2005

IEC TS 61967-3:2005

Superseded Historical

IEC TS 61967-3:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 KHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method

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IEC 62132-5:2005

IEC 62132-5:2005

Withdrawn Most Recent

IEC 62132-5:2005 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method

€186.00

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IEC 62132-1:2006

IEC 62132-1:2006

Superseded Historical

IEC 62132-1:2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions

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IEC 61967-4:2002/AMD1:2006

IEC 61967-4:2002/AMD1:2006

Superseded Historical

IEC 61967-4:2002/AMD1:2006 Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 O/150 O direct coupling method

€23.00

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IEC 62132-4:2006

IEC 62132-4:2006

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IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

€186.00

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IEC TR 61352:2006

IEC TR 61352:2006

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IEC TR 61352:2006 Mnemonics and symbols for integrated circuits

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