Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2008); German version EN 60758:2009.
€150.65
Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections (IEC 49/838/CD:2009)
€98.32
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 49/839/CD:2009)
€116.64
Piezoelectric devices - Preparation of outline drawings of surface mounted devices (SMD) for frequency control and selection - General rules (IEC 49/846/CD:2009)
Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 2: Piezoelectric and dielectric filters (IEC 49/849/CD:2009)
€105.42
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections (IEC 49/848/CD:2009)
€111.40
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers - Part 2 : Guide to the use (IEC 49/832/CD:2008)
Synthetic quartz crystal. Specifications and guidelines for use
€374.00
Optical fibres Product specifications. Sectional specification for class B single-mode
€316.00
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 49/812/CD:2008)
€122.34
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide (IEC 49/811/CDV:2008); German version FprEN 60679-6:2008
Synthetic quartz crystal - Specifications and guidelines for use
€325.00
Ultrasound - Workplace - Measurement, assessment, judgement and reduction
€128.28
Measurement of Quartz Crystal Unit Parameters - Part 11: Standard Method for the determination of the load resonance frequency f and the effective load capacitance C using automatic network analyzer techniques and error correction (IEC 49/806/CD:2008)
€91.03
Quartz crystal controlled oscillators of assessed quality Phase jitter measurement method for quartz and SAW oscillators. Application guide
€193.00
