Piezoelectric sensors - Part 1: Generic specifications (IEC 63041-1:2017); German version EN IEC 63041-1:2018.
€111.40
Surface acoustic wave (SAW) and bulk (BAW) duplexers of assessed quality Guidelines for the use
€269.00
Piezoelectric sensors Generic specifications
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 49/1244/CD:2017)
€84.58
Piezoelectric sensors - Part 1: Generic specifications
€176.00
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016.
€145.14
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 49/1197/CD:2016)
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (IEC 49/1199/CD:2016)
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
€286.00
Sensor devices using piezoelectric bulk or surface acoustic waves - Part 1: Generic specifications (IEC 49/1183A/CD)
€105.42
Sensor devices using piezoelectric bulk or surface acoustic waves - Part 2: Chemical sensors and Biosensors (IEC 49/1184/CD)
Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 49/1180/CD:2016)
€69.91
Measurement techniques of piezoelectric, dieletiric and electrostatic oscillators - Part 3: Frequency aging test methods (IEC 49/1181/CD)
€91.03
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4: Short-term frequency stability test methods (IEC 49/1182/CD)
