Additif 2 à la publication UTE C 86-819 d'avril 1980
€126.00
General principles of measuring methods, revision of publication IEC 60147-2 (transistors, continued)
€41.78
International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
€286.00
Harmonized system of quality assessment for electronic components; Blank detail specification: Ambient-rated bipolar transistors for low and high frequency amplification
€56.17
Harmonized system of quality assessment for electronic components; blank detail specification; bipolar transistors for switching applications
Harmonized system of quality assessment for electronic components; Blank detail specification: Voltage regulator diodes and voltage reference diodes
€48.79
Essential ratings and characteristics IMPATT-diodes
€34.30
Mechanical standardization of semiconductor devices
€269.00
Amendments to the generic specification for semiconductor devices and integrated circuits; sampling requirements for small lots
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors
€193.00
Composants électroniques - Système CENELEC d'assurance de la qualité - Thyristors à température de boîtier spécifiée - Spécification particulière cadre.
€59.33
Revision of the definitions of the terms "transistor", "terminal" and "electrode" in publication 60147-0
Low-power signal diodes; definition of forward recovery time
Composants électroniques - Système CENELEC d'assurance de la qualité - Thyristors à température ambiante spécifiée - Spécification particulière cadre.
Composants électroniques - Système CENELEC d'assurance de la qualité - Diodes de redressement à température de boîtier spécifiée - Spécification particulière cadre.
