C/TT : Test Technology

IEEE 1450.2:2002

IEEE 1450.2:2002

Withdrawn Most Recent

IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification

€203.00

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IEEE 1532:2002

IEEE 1532:2002

Withdrawn Most Recent

IEEE Standard for In-System Configuration of Programmable Devices

€138.00

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IEEE 1532:2001

IEEE 1532:2001

Superseded Historical

IEEE Standard for In-System Configuration of Programmable Devices

€142.00

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IEEE 1149.1:2001 (R2008)

IEEE 1149.1:2001 (R2008)

Superseded Historical

IEEE Standard Test Access Port and Boundary Scan Architecture

€157.00

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IEEE 1149.4:1999

IEEE 1149.4:1999

Superseded Historical

IEEE Standard for a Mixed-Signal Test Bus

€135.00

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IEEE 1532:2000

IEEE 1532:2000

Superseded Historical

IEEE Standard for In-System Configuration of Programmable Devices

€131.00

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IEEE 1450:1999 (R2011)

IEEE 1450:1999 (R2011)

Withdrawn Most Recent

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

€359.00

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IEEE 1149.5:1995

IEEE 1149.5:1995

Withdrawn Most Recent

IEEE Standard for Module Test and Maintenance Bus (MTM-Bus) Protocol

€203.00

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IEEE 1149.1b:1994

IEEE 1149.1b:1994

Superseded Historical

IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)

€138.00

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IEEE 662:1992

IEEE 662:1992

Withdrawn Most Recent

IEEE Standard Terminology for Semiconductor Memory

€146.00

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IEEE 1149.1:1990

IEEE 1149.1:1990

Superseded Historical

IEEE Standard Test Access Port and Boundary-Scan Architecture

€149.00

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IEEE 660:1986

IEEE 660:1986

Withdrawn Most Recent

IEEE Standard for Semiconductor Memory Test Pattern Language

€54.00

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IEEE 662:1980

IEEE 662:1980

Superseded Historical

IEEE Standard Terminology for Semiconductor Memory

€54.00

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