IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
€201.00
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
€275.00
IEEE Standard for Memory Modeling in Core Test Language
€138.00
IEEE Standard for Test Access Port and Boundary-Scan Architecture
€310.00
IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
€103.00
IEEE Standard for Static Component Interconnection Test Protocol and Architecture
€106.00
IEEE Standard for a Mixed-Signal Test Bus
€248.00
IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
€356.00
IEEE Standard for Describing On-Chip Scan Compression
€131.00
IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits
€347.00
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
€350.00
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
€154.00
€121.00
