BOG/SCC20 : SCC20 - Test and Diagnosis for Electronic Systems

IEEE P2848

IEEE P2848

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IEEE Draft Standard for Prognostics and Health Management in Automatic Test Systems

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IEEE/IEC 62529:2024

IEEE/IEC 62529:2024

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IEEE/IEC International Standard for Signal and Test Definition

€201.00

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IEEE 1671.1-2017/Cor 1:2023

IEEE 1671.1-2017/Cor 1:2023

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IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1

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IEEE 1636.1-2018/Cor 1:2023

IEEE 1636.1-2018/Cor 1:2023

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IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML) - Corrigenda 1

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IEEE 1641:2022

IEEE 1641:2022

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IEEE Standard for Signal and Test Definition

€200.00

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IEEE 1505.1:2019

IEEE 1505.1:2019

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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

€156.00

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IEEE 1636.1:2018

IEEE 1636.1:2018

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IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)

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IEEE 1671.1:2017

IEEE 1671.1:2017

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IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions

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IEEE 1871.2:2017

IEEE 1871.2:2017

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IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment

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IEEE/IEC 62243:2010

IEEE/IEC 62243:2010

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IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

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IEEE 1641.1a:2018

IEEE 1641.1a:2018

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IEEE Guide for the Use of IEEE Std 1641(TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language

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IEEE Bundle:2018 : 1671 series 2018

IEEE Bundle:2018 : 1671 series 2018

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IEEE Automatic Test Markup Language (ATML) - IEEE 1671™ Series (Bundle)

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IEEE 1505.3:2015

IEEE 1505.3:2015

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IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard

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IEEE 1671.5:2015

IEEE 1671.5:2015

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IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description

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IEEE 1671.6:2015

IEEE 1671.6:2015

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IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description

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