BOG/SCC20 : SCC20 - Test and Diagnosis for Electronic Systems

IEEE 1871.1:2014

IEEE 1871.1:2014

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IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters

€193.00

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IEEE 1232.3:2014

IEEE 1232.3:2014

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IEEE Guide for the Use of Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

€197.00

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IEEE 1671.4:2014

IEEE 1671.4:2014

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IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration

€107.00

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IEEE 1636.99:2013

IEEE 1636.99:2013

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IEEE Std 1636.99-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements.

€107.00

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IEEE 1641.1:2013

IEEE 1641.1:2013

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IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition

€310.00

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IEEE 1671.2:2012

IEEE 1671.2:2012

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IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description

€107.00

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IEEE/IEC 62529:2012

IEEE/IEC 62529:2012

Superseded Historical

IEC 62529:2012(E) Standard for Signal and Test Definition

€354.00

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IEEE 1641.1:2006

IEEE 1641.1:2006

Superseded Historical

IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition

€107.00

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IEEE 1671:2006

IEEE 1671:2006

Superseded Historical

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

€107.00

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IEEE 771:1998 (R2009)

IEEE 771:1998 (R2009)

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IEEE Guide to the Use of the ATLAS Specification

€205.00

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