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PD IEC TS 62607-12-3:2026
Nanomanufacturing. Key control characteristics 2D material-related products. Schottky barrier heights of material based field-effect transistors: temperature-dependent current-voltage measurements
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| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/15/2026 |
| Page Count | 24 |
| Themes | Voltage |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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