Forthcoming Draft standard
Most Recent

ISO/FDIS 23699:2026

Microbeam analysis — Electron backscatter diffraction — Vocabulary

Summary

This standard gives a specification of general terms for electron backscatter diffraction.

Notes

40.00 : DIS enregistré

Technical characteristics

Publisher International Organization for Standardization (ISO)
Publication Date 06/15/2026
Edition 1
Page Count 11
EAN ---
ISBN ---
Weight (in grams) ---
No products.
No products.