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IPC/JEDEC-9707 - Standard Only:2011
IPC/JEDEC-9707: Spherical Bend Test Method for Characterization of Board Level Interconnects
Summary
This standard on spherical transient bend testing is intended to characterize the maximum allowable strain that a surface mount component's board level interconnects can withstand in flexural loading. Whereas four-point monotonic bend test methods only address simple planar bending, spherical bend tests establish strain limits of board level interconnects under worst-case flexure conditions that can occur during conventional printed board/system assembly, manufacturing and test operations. This method is applicable to surface mounted BGA components larger than 15.0 mm on a side with organically based substrates, attached to printed boards using conventional solder reflow technologies.This document was developed cooperatively with JEDEC. 15 pages. Released 2011.Included in the C-103 and C-1000 Collections.
Technical characteristics
| Publisher | IPC standards by Global Electronics Association |
| Publication Date | 09/13/2011 |
| Edition | 0 |
| Page Count | 15 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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