Summary
This document defines consistent methodologies for computation of in-process defects per million opportunities (DPMO) metrics for any evaluation stage in the assembly process. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC-7912A. A guide to defect categorization is provided that can serve as a base for summarizing and reporting in-process defects when used with J-STD-001 and IPC-A-610. It can also be used to develop process step estimated yield - the expected percentage of assemblies with no defects for a particular process step or combined process steps, based on historical defect rates. 14 pages. Released March 2002.
Purchase both IPC-7912A and IPC-9261 together and save! See IPC-DPMO-202 (DPMO-kit).
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Technical characteristics
| Publisher | IPC standards by Global Electronics Association |
| Publication Date | 01/01/2000 |
| Edition | 0 |
| Page Count | 0 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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