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IEEE/ISO/IEC P29119-14
ISO/IEC/IEEE International Draft Software and systems engineering -- Software testing -- Part 14: Data migration testing
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Summary
New IEEE Standard - Active - Draft.
The purpose of ISO/IEC/IEEE 29119 (all parts) is to define an internationally agreed set of standards for software testing that can be used by any organization when performing any form of software testing. This document defines test processes, test documentation and test approaches that are relevant to data migration testing. The processes defined in this document can be used in conjunction with any software development lifecycle model.
This document describes the test process, related documentation and test approaches for data migration testing. It defines requirements and guidance on the application of ISO/IEC/IEEE 29119-1, ISO/IEC/IEEE 29119-2, ISO/IEC/IEEE 29119-3, ISO/IEC/IEEE 29119-4 and ISO/IEC 20246 to data migration testing. This document requires a risk-based approach to data migration testing and uses risks associated with data migration to identify suitable treatments in the form of various test approaches (including test levels, test types, test practices, static testing, and test design techniques and measures).
This document applies to data migration testing within any system, from inception to release, through to maintenance, support and decommissioning, including in traditional and agile lifecycles.
This document is intended for professional testers (including juniors, seniors and test managers) who
are involved in data migration testing. This document can also benefit delivery leads, developers and project managers that are responsible for governing, managing, and implementing data migration.
This standard is developed in response to a gap in the existing standards base on software testing.
There are no existing ISO standards covering the risk and recommended test types, levels, approaches, and techniques for data migration testing. An existing standard ISO/IEC 13008 Information and documentation—Digital records conversion and migration process, does not cover risk and recommended test types, levels, approaches, and techniques for data migration testing.
The purpose of ISO/IEC/IEEE 29119 (all parts) is to define an internationally agreed set of standards for software testing that can be used by any organization when performing any form of software testing. This document defines test processes, test documentation and test approaches that are relevant to data migration testing. The processes defined in this document can be used in conjunction with any software development lifecycle model.
This document describes the test process, related documentation and test approaches for data migration testing. It defines requirements and guidance on the application of ISO/IEC/IEEE 29119-1, ISO/IEC/IEEE 29119-2, ISO/IEC/IEEE 29119-3, ISO/IEC/IEEE 29119-4 and ISO/IEC 20246 to data migration testing. This document requires a risk-based approach to data migration testing and uses risks associated with data migration to identify suitable treatments in the form of various test approaches (including test levels, test types, test practices, static testing, and test design techniques and measures).
This document applies to data migration testing within any system, from inception to release, through to maintenance, support and decommissioning, including in traditional and agile lifecycles.
This document is intended for professional testers (including juniors, seniors and test managers) who
are involved in data migration testing. This document can also benefit delivery leads, developers and project managers that are responsible for governing, managing, and implementing data migration.
This standard is developed in response to a gap in the existing standards base on software testing.
There are no existing ISO standards covering the risk and recommended test types, levels, approaches, and techniques for data migration testing. An existing standard ISO/IEC 13008 Information and documentation—Digital records conversion and migration process, does not cover risk and recommended test types, levels, approaches, and techniques for data migration testing.
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| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication Date | 01/16/2026 |
| Page Count | 59 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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