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IEC TS 62878-2-4:2015
Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
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Summary
IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 03/27/2015 |
| Release Date | 03/27/2015 |
| Edition | 1 |
| Page Count | 75 |
| Themes | Quality assurance |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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