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IEC TS 62607-6-11:2022
IEC TS 62607-6-11:2022 Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
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Summary
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 02/08/2022 |
| Release Date | 02/08/2022 |
| Edition | 1 |
| Page Count | 27 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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