Superseded
Standard
Historical
IEC PAS 62396-2:2007
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
Preview
Summary
Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 09/18/2007 |
| Release Date | 09/18/2007 |
| Cancellation Date | 12/15/2017 |
| Edition | 1 |
| Page Count | 23 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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