Superseded
Standard
Historical
IEC PAS 62336:2002
Accelerated Moisture Resistance - Unbiased HAST
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Summary
Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/15/2002 |
| Release Date | 08/15/2002 |
| Cancellation Date | 03/09/2004 |
| Edition | 1 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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