Superseded
Standard
Historical
IEC PAS 62206:2000
Power and temperature cycling
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Summary
Aims at determining the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed. It is intended to simulate worst case conditions encountered in typical applications and considered destructive.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 11/28/2000 |
| Release Date | 11/28/2000 |
| Cancellation Date | 03/10/2004 |
| Edition | 1 |
| Page Count | 5 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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