Superseded
Standard
Historical
IEC PAS 62205:2000
High temperature storage life
Preview
Summary
Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 11/28/2000 |
| Release Date | 11/28/2000 |
| Cancellation Date | 04/12/2002 |
| Edition | 1 |
| Page Count | 3 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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