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IEC PAS 62201:2000
A procedure for executing SWEAT
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Summary
Describes an algorithm for executing of the Standard Wafer Level Electromigration Accelerated Test (SWEAT) on computer controlled instrumentation. The algorithm described represents one approach to the execution of SWEAT. Development and employment of other algorithms may produce satisfactory accelerated electromigration test results.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 11/28/2000 |
| Release Date | 11/28/2000 |
| Cancellation Date | 05/17/2004 |
| Edition | 1 |
| Page Count | 22 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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