Superseded
Standard
Historical
IEC PAS 62191:2000
Acoustic microscopy for nonhermetic encapsulated electronic components
Preview
Summary
Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. Provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compounds voids, etc.) nondestructively in plastic packages while achieving reproducibility.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 11/28/2000 |
| Release Date | 11/28/2000 |
| Cancellation Date | 10/17/2001 |
| Edition | 1 |
| Page Count | 16 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
28/11/2000
Superseded
Historical
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