Withdrawn
Standard
Most Recent
IEC PAS 62165:2000
Guidelines for the measurement of thermal resistance of GaAs FETs
Preview
Summary
For power GaAs FET applications requiring high reliability an accurate measurement of thermal resistance is extremely important to provide the user with knowledge of the FET's operating temperature so that more accurate life estimates can be made. FET failure mechanism and failure rates have in general, an exponential dependence on temperature.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/22/2000 |
| Release Date | 08/22/2000 |
| Cancellation Date | 05/17/2004 |
| Edition | 1 |
| Page Count | 10 |
| Themes | Quality assurance |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
22/08/2000
Withdrawn
Most Recent
No products.