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Standard
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IEC PAS 61338-1-5:2010
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
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Summary
IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 05/19/2010 |
| Release Date | 05/19/2010 |
| Cancellation Date | 06/25/2015 |
| Edition | 1 |
| Page Count | 20 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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