Superseded
Standard
Historical
IEC PAS 60679-6:2008
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
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Summary
IEC/PAS 60679-6 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 02/27/2008 |
| Release Date | 02/27/2008 |
| Cancellation Date | 03/14/2011 |
| Edition | 1 |
| Page Count | 21 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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