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IEC 62527:2007

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

Summary

STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 11/07/2007
Release Date 11/07/2007
Edition 1
Page Count 39
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