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IEC 61189-5-503:2017

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards

Summary

IEC 61189-5-503:2017 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 05/22/2017
Release Date 05/22/2017
Edition 1
Page Count 23
Themes Quality assurance
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