Superseded
Standard
Historical
IEC 61164:1995
Reliability growth - Statistical test and estimation methods
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Summary
This standard gives models and numerical methods for reliability growth assessments based on failure data from a single system which were generated in a reliability improvement programme.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 06/27/1995 |
| Release Date | 06/27/1995 |
| Cancellation Date | 03/24/2004 |
| Edition | 1 |
| Page Count | 61 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
27/06/1995
Superseded
Historical
24/03/2004
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