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IEC 61076-5:2001
Connectors for use in d.c., low-frequency analogue and digital high-speed data applications - Part 5: In-line sockets with assessed quality - Sectional specification
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Summary
Defines functional levels, standard test methods and gauges for use in the examination of sockets designed for in-line electronic packages. Lays down appropriate reference dimensions of the mating device and board layout to establish intermateability and interchangeability criteria. Lays down test severity and performance requirements.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 03/22/2001 |
| Release Date | 03/22/2001 |
| Cancellation Date | 03/24/2009 |
| Edition | 1 |
| Page Count | 61 |
| Themes | Quality assurance |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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