Superseded
Standard
Historical
IEC 61000-4-4:2004+AMD1:2010 Consolidated
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
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Summary
IEC 61000-4-4:2004+A1:2010 Establishes a common and reproducible reference for evaluating the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this part of IEC 61000-4 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. The standard defines:
- test voltage waveform;
- range of test levels;
- test equipment;
- verification procedures of test equipment;
- test set-up;
- test procedure.
The standard gives specifications for laboratory and post-installation tests. The contents of the corrigenda of August 2006 and June 2007 have been included in this copy. This consolidated version consists of the second edition (2004) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.
- test voltage waveform;
- range of test levels;
- test equipment;
- verification procedures of test equipment;
- test set-up;
- test procedure.
The standard gives specifications for laboratory and post-installation tests. The contents of the corrigenda of August 2006 and June 2007 have been included in this copy. This consolidated version consists of the second edition (2004) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 03/30/2011 |
| Release Date | 03/30/2011 |
| Cancellation Date | 04/30/2012 |
| Edition | 2.1 |
| Page Count | 65 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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