Superseded
Standard
Historical
IEC 61000-4-11:1994+AMD1:2000 Consolidated
Electromagnetic compatibility (EMC) - Part 4-11: Testing and
measurement techniques - Voltage dips, short
interruptions and voltage variations immunity tests
measurement techniques - Voltage dips, short
interruptions and voltage variations immunity tests
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Summary
This standard defines the immunity test methods and range of
preferred test levels for electrical and electronic equipment
connected to low voltage power supply networks for voltages dips,
short interruptions, and voltage variations. It applies to
electrical and electronic equipment having a rated input current
not exceeding 16 A per phase. It does not apply to electrical and
electronic equipment for connection to d.c. networks or 400 Hz a.c.
networks.
preferred test levels for electrical and electronic equipment
connected to low voltage power supply networks for voltages dips,
short interruptions, and voltage variations. It applies to
electrical and electronic equipment having a rated input current
not exceeding 16 A per phase. It does not apply to electrical and
electronic equipment for connection to d.c. networks or 400 Hz a.c.
networks.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 03/28/2001 |
| Release Date | 03/28/2001 |
| Cancellation Date | 03/24/2004 |
| Edition | 1.1 |
| Page Count | 21 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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