Active
Standard Corrigendum
Most Recent
IEC 60749-8:2002/COR2:2003
IEC 60749-8:2002/COR2:2003 Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Preview
Summary
Modification of the validity date: now put at 2007.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 08/12/2003 |
| Edition | 1.0 |
| Page Count | 0 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
Modifies
30/08/2002
Active
, Modified
Most Recent
Replaced by
30/08/2002
Active
, Modified
Most Recent
Previous versions
30/08/2002
Active
, Modified
Most Recent
No products.